By Sarah Fearn
Over the years, SIMS instrumentation has dramatically replaced because the earliest secondary ion mass spectrometers have been first constructed. tools have been as soon as devoted to both the intensity profiling of fabrics utilizing high-ion-beam currents to examine close to floor to bulk areas of fabrics (dynamic SIMS), or time-of-flight tools that produced complicated mass spectra of the very outer-most floor of samples, utilizing very low-beam currents (static SIMS). Now, with the advance of dual-beam tools those very targeted fields now overlap.
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Extra info for An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics)
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics) by Sarah Fearn